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Modeling Test Escape Rate as a Function of Multiple Coverages.

Kenneth M. ButlerJohn M. Carulli Jr.Jayashree Saxena
Published in: ITC (2008)
Keyphrases
  • neural network
  • machine learning
  • information systems
  • test data
  • database
  • relational databases
  • multiresolution
  • test cases
  • software testing