Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.
Ke HuangNathan KuppConstantinos XanthopoulosJohn M. Carulli Jr.Yiorgos MakrisPublished in: IEEE Des. Test (2015)
Keyphrases
- low cost
- complex systems
- parameter estimation
- experimental data
- circuit design
- prior knowledge
- test set
- statistical models
- radio frequency
- real time
- integrated circuit
- mathematical models
- correlation coefficient
- rate distortion
- process model
- machine learning algorithms
- model selection
- relevance feedback
- case study
- information systems