Simulation-Based Functional Test Generation for Embedded Processors.
Charles H.-P. WenLi-C. WangKwang-Ting ChengPublished in: IEEE Trans. Computers (2006)
Keyphrases
- test generation
- embedded processors
- test cases
- symbolic execution
- single chip
- design automation
- static analysis
- parallel implementation
- quality assurance
- low cost
- hardware and software
- data processing
- computer vision
- software testing
- low power
- image quality
- open source
- high quality
- high level
- code coverage
- information systems