Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor.
Xiaoxiao WangLeRoy WinembergDonglin SuDat TranSaji GeorgeNisar AhmedSteve PaloshAllan DobinMark M. TehranipoorPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2015)