Login / Signup

Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study.

Dragoljub Gagi DrmanacMichael Laisne
Published in: ITC (2011)
Keyphrases
  • cost reduction
  • cost savings
  • lead time
  • case study
  • machine learning
  • objective function
  • search algorithm
  • expert systems
  • test cases
  • branch and bound