Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data.
Sounil BiswasR. D. (Shawn) BlantonPublished in: VTS (2008)
Keyphrases
- test data
- mixed signal
- vlsi circuits
- low power
- test cases
- multi channel
- training data
- test set
- digital circuits
- data sets
- training set
- power consumption
- high speed
- training and test data
- cmos technology
- training examples
- training samples
- low cost
- real time
- reinforcement learning
- test suite
- digital signal processing
- face recognition
- feature vectors