Specification Test Compaction for Analog Circuits and MEMS

Sounil Biswas Peng Li R. D. (Shawn) Blanton Larry T. Pileggi

Published in: CoRR (2007)

Keyphrases

analog circuits
digital circuits
fault diagnosis
neural network
formal specification
high level
computer vision
image processing
pattern recognition
test cases
conceptual model
statistical tests
wavelet packet transform