Sign in
Specification Test Compaction for Analog Circuits and MEMS.
Sounil Biswas
Peng Li
R. D. (Shawn) Blanton
Larry T. Pileggi
Published in:
DATE (2005)
Keyphrases
</>
analog circuits
fault diagnosis
wavelet packet transform
neural network
decision making
real time
data sets
knowledge base
digital circuits
data mining
machine learning
high level
np complete