Specification Test Compaction for Analog Circuits and MEMS.

Sounil Biswas Peng Li R. D. (Shawn) Blanton Larry T. Pileggi

Published in: DATE (2005)

Keyphrases

analog circuits
fault diagnosis
wavelet packet transform
neural network
decision making
real time
data sets
knowledge base
digital circuits
data mining
machine learning
high level
np complete