Geir Eide

Publication Activity (10 Years)

Years Active: 2002-2021
Publications (10 Years): 3

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Publications

Yu Huang, Haitao Fu, Bin Deng, Edward Seng, Marc Hutner, Jean-Francois Cote, Geir Eide
The Advancement of 1149.10. ITC-Asia (2021)
Jean-François Côté, Mark Kassab, Wojciech Janiszewski, Ricardo Rodrigues, Reinhard Meier, Bartosz Kaczmarek, Peter Orlando, Geir Eide, Janusz Rajski, Glenn Colón-Bonet, Naveen Mysore, Ya Yin, Pankaj Pant
Streaming Scan Network (SSN): An Efficient Packetized Data Network for Testing of Complex SoCs. ITC (2020)
Wu-Tung Cheng, Randy Klingenberg, Brady Benware, Wu Yang, Manish Sharma, Geir Eide, Yue Tian, Sudhakar M. Reddy, Yan Pan, Sherwin Fernandes, Atul Chittora
Automatic Identification of Yield Limiting Layout Patterns Using Root Cause Deconvolution on Volume Scan Diagnosis Data. ATS (2017)
Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Des. Test 30 (4) (2013)
Markus Seuring, Michael Braun, Alan Ma, Geir Eide, Kathy Yang, Huaxing Tang
Employing the STDF V4-2007 Standard for Scan Test Data Logging. IEEE Des. Test 29 (6) (2012)
Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li
ITC 2003 panels: Part 2. IEEE Des. Test Comput. 21 (3) (2004)
Geir Eide, Kenneth E. Posse
Open Microphone - My DFT is better than yours ... ITC (2003)
Kenneth E. Posse, Geir Eide
Key Impediments to DFT-Focused Test and How to Overcome Them. ITC (2003)
Geir Eide
Design-for-Test Techniques for SoC Designs (Tutorial Abstract). ISQED (2002)
Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian
Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC (2002)