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Embedded Deterministic Test for Low-Cost Manufacturing Test.

Janusz RajskiJerzy TyszerMark KassabNilanjan MukherjeeRob ThompsonKun-Han TsaiAndre HertwigNagesh TamarapalliGrzegorz MrugalskiGeir EideJun Qian
Published in: ITC (2002)
Keyphrases
  • low cost
  • database
  • databases
  • neural network
  • website
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  • objective function
  • low power
  • statistical tests