Chao-Wen Tseng

Publication Activity (10 Years)

Years Active: 1998-2016
Publications (10 Years): 1

Top Topics

Rfid Middleware

Application Level

Information Providers

Top Venues

IEICE Trans. Inf. Syst.

iThings/GreenCom/CPSCom

Publications

Chao-Wen Tseng, Yu-Chang Chen, Chua-Huang Huang
A Design of GS1 EPCglobal Application Level Events Extension for IoT Applications. IEICE Trans. Inf. Syst. (1) (2016)
Chao-Wen Tseng, Chua-Huang Huang
A uniform EPC scheme design of IEEE 1451 transducers for IoT applications. ICUFN (2014)
Chao-Wen Tseng, Yu-Sheng Lin, Wei-Han Lu, Chua-Huang Huang
Extending EPCglobal ALE middleware to integrate transducer capability of IEEE 1451 standards. ICUFN (2014)
Chao-Wen Tseng, Yi-Ting Liao, Chua-Huang Huang
Adding IEEE 1451 Transducer Capability to EPCglobal Information Service. iThings/GreenCom/CPSCom (2014)
Chao-Wen Tseng, Chih-Ming Chang, Chua-Huang Huang
Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451. IOT (2012)
James Chien-Mo Li, Po-Chou Lin, Chih-Ming Chiang, Chuo-Jan Pan, Chao-Wen Tseng
Effective and Economic Phase Noise Testing for Single-Chip TV Tuners. IEEE Trans. Instrum. Meas. 57 (10) (2008)
Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra
ELF-Murphy Data on Defects and Test Sets. VTS (2004)
Chao-Wen Tseng, James Li, Edward J. McCluskey
Experimental Results for Slow-Speed Testing. VTS (2002)
Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
Testing for resistive opens and stuck opens. ITC (2001)
Chao-Wen Tseng, Edward J. McCluskey
Multiple-output propagation transition fault test. ITC (2001)
Chao-Wen Tseng, Ray Chen, Edward J. McCluskey, Phil Nigh
MINVDD Testing for Weak CMOS ICs. VTS (2001)
Chao-Wen Tseng, Subhasish Mitra, Edward J. McCluskey, Scott Davidson
An Evaluation of Pseudo Random Testing for Detecting Real Defects. VTS (2001)
Chao-Wen Tseng, Edward J. McCluskey, Xiaoping Shao, David M. Wu
Cold Delay Defect Screening. VTS (2000)
Edward J. McCluskey, Chao-Wen Tseng
Stuck-fault tests vs. actual defects. ITC (2000)
Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC (1998)
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey
Experimental Results for IDDQ and VLV Testing. VTS (1998)