Jonathan T.-Y. Chang

Publication Activity (10 Years)

Years Active: 1996-1998
Publications (10 Years): 0

Publications

Jonathan T.-Y. Chang, Edward J. McCluskey
Detecting resistive shorts for CMOS domino circuits. ITC (1998)
Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey
Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. ITC (1998)
Jonathan T.-Y. Chang, Chao-Wen Tseng, Yi-Chin Chu, Sanjay Wattal, Mike Purtell, Edward J. McCluskey
Experimental Results for IDDQ and VLV Testing. VTS (1998)
Jonathan T.-Y. Chang, Edward J. McCluskey
SHOrt voltage elevation (SHOVE) test for weak CMOS ICs. VTS (1997)
Jonathan T.-Y. Chang, Edward J. McCluskey
Quantitative analysis of very-low-voltage testing. VTS (1996)
Jonathan T.-Y. Chang, Edward J. McCluskey
Detecting Delay Flaws by Very-Low-Voltage Testing. ITC (1996)