Scott Davidson

ORCID

Publication Activity (10 Years)

Years Active: 1975-2023
Publications (10 Years): 62

Top Venues

Publications

Huwan Peng, Scott Davidson, Richard Shi, Shuaiwen Leon Song, Michael B. Taylor
Chiplet Cloud: Building AI Supercomputers for Serving Large Generative Language Models. CoRR (2023)
Scott Davidson
Is There an Answer? IEEE Des. Test 40 (2) (2023)
Scott Davidson
Training Data Sets: The Source of Our Woes? IEEE Des. Test 40 (1) (2023)
Scott Davidson
Our Gated Community. IEEE Des. Test 40 (4) (2023)
Scott Davidson
Calling Yourself Back. IEEE Des. Test 40 (5) (2023)
Scott Davidson
Security Arms Race. IEEE Des. Test 39 (4) (2022)
Scott Davidson
Standing on the Shoulders of ... IEEE Des. Test 39 (5) (2022)
Scott Davidson
Small Is Good. IEEE Des. Test 39 (6) (2022)
Scott Davidson
Benchmarking Benchmarking. IEEE Des. Test 39 (3) (2022)
Scott Davidson
25 Years (and a Bit More) of The Last Byte. IEEE Des. Test 39 (1) (2022)
Scott Davidson
The Memory Shuffle. IEEE Des. Test 39 (2) (2022)
Scott Davidson
Computing in the Real World. IEEE Des. Test 38 (6) (2021)
Scott Davidson
The Road to Open-Source EDA. IEEE Des. Test 38 (2) (2021)
Gus Henry Smith, Andrew Liu, Steven Lyubomirsky, Scott Davidson, Joseph McMahan, Michael B. Taylor, Luis Ceze, Zachary Tatlock
Pure tensor program rewriting via access patterns (representation pearl). MAPS@PLDI (2021)
Gus Henry Smith, Andrew Liu, Steven Lyubomirsky, Scott Davidson, Joseph McMahan, Michael B. Taylor, Luis Ceze, Zachary Tatlock
Pure Tensor Program Rewriting via Access Patterns (Representation Pearl). CoRR (2021)
Scott Davidson
Hacking in the Dark. IEEE Des. Test 38 (1) (2021)
Scott Davidson
Security Begins at Home. IEEE Des. Test 38 (3) (2021)
Scott Davidson
Bad Design Inside of You. IEEE Des. Test 38 (5) (2021)
Scott Davidson
Being Learned. IEEE Des. Test 38 (4) (2021)
Michael Bedford Taylor, Luis Vega, Moein Khazraee, Ikuo Magaki, Scott Davidson, Dustin Richmond
ASIC clouds: specializing the datacenter for planet-scale applications. Commun. ACM 63 (7) (2020)
Scott Davidson
The Last Byte: Are You Sure You Love That Store? IEEE Des. Test 37 (2) (2020)
Daniel Petrisko, Farzam Gilani, Mark Wyse, Dai Cheol Jung, Scott Davidson, Paul Gao, Chun Zhao, Zahra Azad, Sadullah Canakci, Bandhav Veluri, Tavio Guarino, Ajay Joshi, Mark Oskin, Michael Bedford Taylor
BlackParrot: An Agile Open-Source RISC-V Multicore for Accelerator SoCs. IEEE Micro 40 (4) (2020)
Scott Davidson
Transitional Phones. IEEE Des. Test 37 (5) (2020)
Dai Cheol Jung, Scott Davidson, Chun Zhao, Dustin Richmond, Michael Bedford Taylor
Ruche Networks: Wire-Maximal, No-Fuss NoCs : Special Session Paper. NOCS (2020)
Scott Davidson
The Last Byte: Big Data, Big Faults. IEEE Des. Test 37 (1) (2020)
Scott Davidson
The Last Byte: 3-D TV? We Got 6-D TV! IEEE Des. Test 37 (3) (2020)
Scott Davidson
My Friendly Orange Glow. IEEE Des. Test 37 (4) (2020)
Scott Davidson
Too Many Cooks Make the Product. IEEE Des. Test 37 (6) (2020)
Daniel Petrisko, Chun Zhao, Scott Davidson, Paul Gao, Dustin Richmond, Michael Bedford Taylor
NoC Symbiosis : (Special Session Paper). NOCS (2020)
Austin Rovinski, Chun Zhao, Khalid Al-Hawaj, Paul Gao, Shaolin Xie, Christopher Torng, Scott Davidson, Aporva Amarnath, Luis Vega, Bandhav Veluri, Anuj Rao, Tutu Ajayi, Julian Puscar, Steve Dai, Ritchie Zhao, Dustin Richmond, Zhiru Zhang, Ian Galton, Christopher Batten, Michael B. Taylor, Ronald G. Dreslinski
A 1.4 GHz 695 Giga Risc-V Inst/s 496-Core Manycore Processor With Mesh On-Chip Network and an All-Digital Synthesized PLL in 16nm CMOS. VLSI Circuits (2019)
Scott Davidson
The Last Byte: IoT and That Nagging Feeling. IEEE Des. Test 36 (4) (2019)
Scott Davidson
The Last Byte: System Testing Ourselves. IEEE Des. Test 36 (3) (2019)
Scott Davidson
Is This a System? IEEE Des. Test 36 (1) (2019)
Scott Davidson
The Last Byte: The Internet of People. IEEE Des. Test 36 (5) (2019)
Scott Davidson
The Last Byte: I Have Met the IoT Security Enemy and He Is Us. IEEE Des. Test 36 (2) (2019)
Shaolin Xie, Scott Davidson, Ikuo Magaki, Moein Khazraee, Luis Vega, Lu Zhang, Michael B. Taylor
Extreme Datacenter Specialization for Planet-Scale Computing: ASIC Clouds. ACM SIGOPS Oper. Syst. Rev. 52 (1) (2018)
Scott Davidson
The Joy of Scheduling. IEEE Des. Test 35 (4) (2018)
Scott Davidson
The Last Byte: Real Time, Real People. IEEE Des. Test 35 (2) (2018)
Scott Davidson
Electronic Design Automation for IC Implementation, Circuit Design, and Process Technology and Electronic Design Automation for IC System Design, Verification, and Testing. IEEE Des. Test 35 (3) (2018)
Scott Davidson
Running on Empty. IEEE Des. Test 35 (6) (2018)
Scott Davidson, Shaolin Xie, Christopher Torng, Khalid Al-Hawaj, Austin Rovinski, Tutu Ajayi, Luis Vega, Chun Zhao, Ritchie Zhao, Steve Dai, Aporva Amarnath, Bandhav Veluri, Paul Gao, Anuj Rao, Gai Liu, Rajesh K. Gupta, Zhiru Zhang, Ronald G. Dreslinski, Christopher Batten, Michael B. Taylor
The Celerity Open-Source 511-Core RISC-V Tiered Accelerator Fabric: Fast Architectures and Design Methodologies for Fast Chips. IEEE Micro 38 (2) (2018)
Scott Davidson
Computers with Tailfins? IEEE Des. Test 35 (3) (2018)
Scott Davidson
Technobabble. IEEE Des. Test 35 (1) (2018)
Scott Davidson
Self-Test and Self-Aware. IEEE Des. Test 35 (5) (2018)
Alric Althoff, Joseph McMahan, Luis Vega, Scott Davidson, Timothy Sherwood, Michael B. Taylor, Ryan Kastner
Hiding Intermittent Information Leakage with Architectural Support for Blinking. ISCA (2018)
Scott Davidson
Engineering Secure Internet of Things Systems. IEEE Des. Test 34 (5) (2017)
Scott Davidson
Cyber-Physical System Design With Sensor Networking Technologies. IEEE Des. Test 34 (3) (2017)
Scott Davidson
To Verification Infinity and Beyond. IEEE Des. Test 34 (5) (2017)
Scott Davidson
Practice Makes Perfect. IEEE Des. Test 34 (4) (2017)
Scott Davidson
Being Connected. IEEE Des. Test 34 (3) (2017)
Scott Davidson
Chips Thinking About Chips. IEEE Des. Test 34 (6) (2017)
Scott Davidson
Research Is Its Own Reward. IEEE Des. Test 34 (1) (2017)
Scott Davidson
Dark Silicon, Antiparallelism, and Too Much Work. IEEE Des. Test 34 (2) (2017)
Scott Davidson
Good Enough Computing. IEEE Des. Test 33 (1) (2016)
Scott Davidson
And He Built a Crooked Chip. IEEE Des. Test 33 (3) (2016)
Scott Davidson
The Five Stages of Project Grief. IEEE Des. Test 33 (2) (2016)
Scott Davidson
The Intestinal Superhighway. IEEE Des. Test 33 (4) (2016)
Scott Davidson
Where Are We Going? IEEE Des. Test 33 (5) (2016)
Scott Davidson
Getting Credit. IEEE Des. Test 32 (2) (2015)
Scott Davidson
Time Out of Mind. IEEE Des. Test 32 (3) (2015)
Scott Davidson
Chips That Do Things. IEEE Des. Test 32 (6) (2015)
Scott Davidson
A 3-D Forward into the Past. IEEE Des. Test 32 (4) (2015)
Scott Davidson
50 Years of DAC Moments. IEEE Des. Test 31 (2) (2014)
Scott Davidson
Hey, you, get onna my cloud [The Last Byte]. IEEE Des. Test 31 (3) (2014)
Scott Davidson
A Truly Wireless Future? IEEE Des. Test 31 (6) (2014)
Scott Davidson
Planned Unobsolescence. IEEE Des. Test 30 (6) (2013)
Scott Davidson
Testing high-frequency and low-power designs: Do the standard rules and tools apply? ITC (2012)
Scott Davidson
Yield of Black Swans. IEEE Des. Test Comput. 29 (1) (2012)
Scott Davidson
A World Without Standards. IEEE Des. Test Comput. 29 (2) (2012)
Scott Davidson
At the beginning. IEEE Des. Test Comput. 29 (3) (2012)
Scott Davidson
Energy Efficiency Like Your Momma Used to Make. IEEE Des. Test Comput. 29 (4) (2012)
Scott Davidson
All About Liquid Scan Chains - and More [review of "Digital Microfluidic Biochips: Design Automation and Optimization" (Chakrabarty, K. and Xu, T.; 2010)]. IEEE Des. Test Comput. 28 (3) (2011)
Liang-Chi Chen, Peter Dahlgren, Paul Dickinson, Scott Davidson
processors. ITC (2011)
Scott Davidson
About the power problem [review of "Power-Aware Testing and Test Strategies for Low Power Devices" (Girard, P., Eds., et.; 2010)]. IEEE Des. Test Comput. 27 (6) (2010)
Scott Davidson
Concurrent checking for logic [review of "New Methods of Concurrent Checking (Goessel, M., et al; 2008)]. IEEE Des. Test Comput. 27 (3) (2010)
Liang-Chi Chen, Paul Dickinson, Peter Dahlgren, Scott Davidson, Olivier Caty, Kevin Wu
T2 family. ITC (2009)
Scott Davidson
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. IEEE Des. Test Comput. 26 (1) (2009)
Scott Davidson
Book Review: A book on system test, and testing systems also. IEEE Des. Test Comput. 26 (3) (2009)
Scott Davidson
The Last Byte: Too many reboots. IEEE Des. Test Comput. 26 (6) (2009)
Scott Davidson
Book Reviews: A guide for the wrapper perplexed. IEEE Des. Test Comput. 26 (6) (2009)
Scott Davidson
Justifying DFT with a Hierarchical Top-Down Cost-Benefit Model. ITC (2008)
Scott Davidson, Nur A. Touba
Guest Editors' Introduction: Progress in Test Compression. IEEE Des. Test Comput. 25 (2) (2008)
Scott Davidson
How to make your own processor architecture. IEEE Des. Test Comput. 25 (1) (2008)
Scott Davidson
The commonality of vector generation techniques. IEEE Des. Test Comput. 25 (2) (2008)
Scott Davidson
With pick and shovel through our data. IEEE Des. Test Comput. 25 (4) (2008)
Scott Davidson, Helen Davidson
The Psychology of Electronic Test. IEEE Des. Test Comput. 24 (5) (2007)
Scott Davidson
A laboratory right under your nose. IEEE Des. Test Comput. 24 (1) (2007)
Scott Davidson
Book Reviews: Test Tutorials in Book Form. IEEE Des. Test Comput. 24 (5) (2007)
Scott Davidson
How do we train today's students to become tomorrow's engineers? IEEE Des. Test Comput. 24 (4) (2007)
Scott Davidson
A textbook with two target audiences. IEEE Des. Test Comput. 24 (2) (2007)
Scott Davidson
Losing control. IEEE Des. Test Comput. 24 (2) (2007)
Scott Davidson, Anthony P. Ambler, Helen Davidson
Behavioral Test Economics. ITC (2006)
Scott Davidson
Who Reads This Stuff Anyway? IEEE Des. Test Comput. 23 (4) (2006)
Scott Davidson
All about getting it. IEEE Des. Test Comput. 23 (1) (2006)
Scott Davidson
An insider's look at microprocessor design. IEEE Des. Test Comput. 23 (2) (2006)
Scott Davidson
Searching for clues: Diagnosing IC failures. IEEE Des. Test Comput. 23 (1) (2006)
Scott Davidson
Book Reviews: A Comprehensive EDA Handbook. IEEE Des. Test Comput. 23 (5) (2006)
Scott Davidson
Understanding NTF components from the field. ITC (2005)
Scott Davidson
Guest Editor's Introduction: ITC Examines How Test Helps the Fittest Survive. IEEE Des. Test Comput. 22 (6) (2005)
Scott Davidson
What's the problem? IEEE Des. Test Comput. 22 (4) (2005)

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Publication Activity (10 Years)

Top Topics

Top Venues

Scott Davidson