Testing high-frequency and low-power designs: Do the standard rules and tools apply?
Scott DavidsonPublished in: ITC (2012)
Keyphrases
- high frequency
- low power
- low frequency
- power consumption
- low cost
- high speed
- visual quality
- high frequencies
- single chip
- nm technology
- subband
- high resolution
- wavelet coefficients
- wavelet transform
- low power consumption
- vlsi circuits
- wavelet domain
- discrete wavelet transform
- high frequency components
- image processing
- filter bank
- power reduction
- cmos technology
- logic circuits
- mixed signal
- image segmentation
- power dissipation
- image sensor