Anthony P. Ambler

Publication Activity (10 Years)

Years Active: 1984-2009
Publications (10 Years): 0

Publications

Lftikhar Khan, Taikyeong T. Jeong, Gyung-Leen Park, Anthony P. Ambler
A HW/SW Co-design Methodology: An Accurate Power Efficiency Model and Design Metrics for Embedded System. SNPD (2009)
Scott Davidson, Anthony P. Ambler, Helen Davidson
Behavioral Test Economics. ITC (2006)
Taikyeong T. Jeong, Anthony P. Ambler
Design Trade-Offs and Power Reduction Techniques for High Performance Circuits and System. ICCSA (5) (2006)
Il-soo Lee, Jae-Hoon Jeong, Anthony P. Ambler
Using the Nonlinear Property of FSR and Dictionary Coding for Reduction of Test Volume. ISVLSI (2005)
Il-soo Lee, Yu-Ting Lin, Anthony P. Ambler
Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set. ISVLSI (2005)
Anthony P. Ambler
Is It Rocket Science? ITC (2002)
David Williams, Anthony P. Ambler
System Manufacturing Test Cost Model. ITC (2002)
Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman
From DFT to systems test - a model based cost optimization tool. DATE (2001)
Des Farren, Anthony P. Ambler
The Economics of System-Level Testing. IEEE Des. Test Comput. 14 (3) (1997)
Des Farren, Anthony P. Ambler
Cost-Effective System-Level Test Strategies. ITC (1995)
J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler
Sensitivity analysis in economics based test strategy planning. J. Electron. Test. 5 (2-3) (1994)
I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
Test strategy planning using economic analysis. J. Electron. Test. 5 (2-3) (1994)
Des Farren, Anthony P. Ambler
System Test Cost Modelling Based on Event Rate Analysis. ITC (1994)
Chryssa Dislis, J. H. Dick, Anthony P. Ambler
Algorithms for Cost Optimised Test Strategy Selection. ITC (1993)
Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC (1993)
Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
Economics in Design and Test. ICCD (1993)
Anthony P. Ambler
The application and use of boundary scan: Bleeker, H, van den Eijnden, P and de Jong, FBoundary-scan test - a practical approach Kluwer Academic (1992) ISBN 0 7923 9296 5, £50.75, pp 222. Microprocess. Microsystems 17 (5) (1993)
Alaa F. Alani, Gerry Musgrave, Anthony P. Ambler
A Steady-State Response Test Generation for Mixed-Signal Integrated Circuits. ITC (1992)
I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
Economic Effects in Design and Test. IEEE Des. Test Comput. 8 (4) (1991)
Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
Cost Analysis of Test Method Environments. ITC (1989)
J. R. Miles, Anthony P. Ambler, K. A. E. Totton
Estimation of area and performance overheads for testable VLSI circuits. ICCD (1988)
Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. ITC (1986)
M. E. Glazier, Anthony P. Ambler
Ultimate: A hardware logic simulation engine. DAC (1984)
Prab Varma, Anthony P. Ambler, Keith Baker
An Analysis of the Economics of Self Test. ITC (1984)