Login / Signup
Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI.
Mark Paraskeva
Anthony P. Ambler
D. F. Burrows
W. L. Knight
I. D. Dear
Published in:
ITC (1986)
Keyphrases
</>
image features
feature space
co occurrence
feature extraction
feature vectors
low level
svm classifier
data sets
website
classification accuracy
key features
structural information
feature values