Chryssa Dislis

Publication Activity (10 Years)

Years Active: 1989-2002
Publications (10 Years): 0

Publications

Chryssa Dislis
Improving Service Availability via Low-Outage Upgrades. COMPSAC (2002)
Deirdre Donovan, Chryssa Dislis, Ray Murphy, Stephen Unger, Christina Kenneally, Janet Young, Liz Sheehan
Incorporating Software Reliability Engineering into the Test Process for an Extensive GUI-Based Network Management System. ISSRE (2001)
Simon Martin, Robert Bleck, Chryssa Dislis, Des Farren
The evolution of a system test process [for Motorola GSM products]. ITC (1999)
Norma Barrett, Simon Martin, Chryssa Dislis
Test process optimization: closing the gap in the defect spectrum. ITC (1999)
William S. Harwin, Lee O. Leiber, Gregory P. G. Austwick, Chryssa Dislis
Clinical potential and design of programmable mechanical impedances for orthotic applications. Robotica 16 (5) (1998)
Chryssa Dislis, Gerry Musgrave, Roger B. Hughes
Formal Design Techniques - Theory and Engineering Reality. Asian Test Symposium (1998)
David E. Schimmel, Chryssa Dislis
Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. IEEE Des. Test Comput. 15 (3) (1998)
Chryssa Dislis, Ian P. Jalowiecki
Economics Modelling and Optimisation of MCM Test Strategies. ED&TC (1996)
Chryssa Dislis, A. F. Al-Ani, Ian P. Jalowiecki
MCM Quality and Cost Analysis Using Economics Models. ITC (1995)
J. H. Dick, Erwin Trischler, Chryssa Dislis, Anthony P. Ambler
Sensitivity analysis in economics based test strategy planning. J. Electron. Test. 5 (2-3) (1994)
I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
Test strategy planning using economic analysis. J. Electron. Test. 5 (2-3) (1994)
Chryssa Dislis, J. H. Dick, Anthony P. Ambler
Algorithms for Cost Optimised Test Strategy Selection. ITC (1993)
Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler
Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. ITC (1993)
Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick
Economics in Design and Test. ICCD (1993)
I. D. Dear, Chryssa Dislis, Anthony P. Ambler, J. H. Dick
Economic Effects in Design and Test. IEEE Des. Test Comput. 8 (4) (1991)
Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler
Cost Analysis of Test Method Environments. ITC (1989)