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Reduction of Power and Test Time by Removing Cluster of Don't-Care from Test Data Set.

Il-soo LeeYu-Ting LinAnthony P. Ambler
Published in: ISVLSI (2005)
Keyphrases
  • data sets
  • long term
  • genetic algorithm
  • website
  • database
  • real world
  • computer vision
  • test data