Michael G. Wahl

Publication Activity (10 Years)

Years Active: 1989-2021
Publications (10 Years): 4

Top Topics

Semiconductor Manufacturing

Top Venues

VISIGRAPP (Revised Selected Papers)

Publications

Peter Stich, Rebecca Busch, Michael G. Wahl, Christian Weber, Madjid Fathi
Branch selection and data optimization for selecting machines for processes in semiconductor manufacturing using AI-based predictions. EIT (2021)
Peter Stich, Michael G. Wahl, Peter Czerner, Christian Weber, Madjid Fathi
Yield prediction in semiconductor manufacturing using an AI-based cascading classification system. EIT (2020)
Tanja Joan Eiler, Armin Grünewald, Michael G. Wahl, Rainer Brück
AAT Meets Virtual Reality. VISIGRAPP (Revised Selected Papers) (2019)
Armin Grünewald, Michael G. Wahl, Rainer Brück
Cost modeling and analysis for the design, manufacturing and test of 3D-ICs. 3DIC (2015)
Armin Grünewald, Michael G. Wahl, Rainer Brück
Manufacturing and test assistance for 3D-Integrated heterogeneous systems. 3DIC (2014)
Alexander Kordes, Bart Vermeulen, Abhijit K. Deb, Michael G. Wahl
Startup error detection and containment to improve the robustness of hybrid FlexRay networks. DATE (2014)
Thomas Lehner, Andreas Kuhr, Michael G. Wahl, Rainer Brück
Site dependencies in a multisite testing environment. ETS (2014)
Oliver Spang, Hans Martin von Staudt, Michael G. Wahl
A sophisticated memory test engine for LCD display drivers. DATE (2007)
Michael G. Wahl, Sudipta Bhawmik, Kamran Zarrineh, Pradipta Ghosh, Scott Davidson, Peter Harrod
The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data. ITC (2003)
Michael G. Wahl, Anthony P. Ambler, Christoph Maaß, Mohammed Rahman
From DFT to systems test - a model based cost optimization tool. DATE (2001)
Manfred Koegst, Dieter Garte, Peter Conradi, Michael G. Wahl
A Systematic Analysis of Reuse Strategies for Design of Electronic Circuits. DATE (1998)
Michael G. Wahl, Holger Völkel
A VHDL SGRAM Model for the Validation Environment of a High Performance Graphic Processor. DATE (1998)
Peter Conradi, Ulrich Heinkel, Michael G. Wahl
Introducing multimedia in teaching of digital system design. MSE (1997)
Michael G. Wahl, Carol Pyron
EDIF Test - The Upcoming Standard for Test Data Transfers. ITC (1992)
William W. Sebesta, Bas Verhelst, Michael G. Wahl
Development of a new standard for test. ITC (1990)
Johannes Pfeifer, Michael G. Wahl, Hans Wojtkowiak
Data exchange formats for testing. Microprocessing and Microprogramming 27 (1-5) (1989)