Carol Pyron

Publication Activity (10 Years)

Years Active: 1989-2003
Publications (10 Years): 0

Publications

Tim McDougall, Atanas N. Parashkevov, Simon Jolly, Juhong Zhu, Jing Zeng, Carol Pyron, Magdy S. Abadir
An automated method for test model generation from switch level circuits. ASP-DAC (2003)
Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu
Automated Test Model Generation from Switch Level Custom Circuits. Asian Test Symposium (2003)
Carol Pyron
Scan and BIST Can Almost Achieve Test Quality Levels. ITC (2002)
Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger
Silicon Symptoms to Solutions: Applying Design for Debug Techniques. ITC (2002)
John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. ITC (2002)
Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina
At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. VTS (2000)
Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar
DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. ITC (1999)
Carol Pyron, Javier Prado, James Golab
Test Strategy for the PowerPC 750 Microprocessor. IEEE Des. Test Comput. 15 (3) (1998)
Carol Pyron, Javier Prado, James Golab
Microprocessor Test Strategy Improvements. ITC (1997)
Carol Pyron, W. C. Bruce
RISC Microprocessor Family. ITC (1995)
Michael G. Wahl, Carol Pyron
EDIF Test - The Upcoming Standard for Test Data Transfers. ITC (1992)
Carol Pyron
Representing Boundary Scan Tests with the EDIF Test View. ITC (1991)
Carol Pyron, Rex Sallade
CAE Functionality for Verification of Diagnostic Programs. ITC (1989)