Robert F. Molyneaux

Publication Activity (10 Years)

Years Active: 1989-2007
Publications (10 Years): 0

Publications

Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh
Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip. ITC (2007)
Robert F. Molyneaux
Debug and Diagnosis in the Age of System-on-a-Chip. ITC (2003)
Rajesh Raina, Robert Bailey, Dawit Belete, Vikram Khosa, Robert F. Molyneaux, Javier Prado, Ashutosh Razdan
microprocessor. ITC (2000)
Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina
At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor. VTS (2000)
Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar
DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor. ITC (1999)
Rajesh Raina, Robert F. Molyneaux
Random Self-Test Method - Applications on PowerPC (tm) Microprocessor Caches. Great Lakes Symposium on VLSI (1998)
Rajesh Raina, Charles Njinda, Robert F. Molyneaux
How Seriously Do You Take Your Possible-Detect Faults? ITC (1997)
Rajesh Raina, Robert Bailey, Charles Njinda, Robert F. Molyneaux, Charlie Beh
Efficient Testing of Clock Regenerator Circuits in Scan Designs. DAC (1997)
Robert F. Molyneaux, Alexander Albicki
Comments on "Ternary Scan Design for VLSI Testability". IEEE Trans. Computers 38 (2) (1989)