Alexander Albicki

Publication Activity (10 Years)

Years Active: 1985-1996
Publications (10 Years): 0

Publications

Razak Hossain, Menghui Zheng, Alexander Albicki
Reducing power dissipation in CMOS circuits by signal probability based transistor reordering. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15 (3) (1996)
Leszek D. Wronski, Razak Hossain, Alexander Albicki
Extended hyperbolic congruential frequency hop code: generation and bounds for cross- and auto-ambiguity function. IEEE Trans. Commun. 44 (3) (1996)
Yu Fang, Alexander Albicki
Efficient testability enhancement for combinational circuit. ICCD (1995)
Menghui Zheng, Alexander Albicki
Low power and high speed multiplication design through mixed number representations. ICCD (1995)
Andrzej Sobski, Alexander Albicki
High Throughput Error Control Using Parallel CRC. VLSI Design 2 (1) (1994)
Xiaodong Xie, Alexander Albicki
New advances in path delay fault testing of combinational circuits. VTS (1994)
Razak Hossain, Leszek D. Wronski, Alexander Albicki
Low power design using double edge triggered flip-flops. IEEE Trans. Very Large Scale Integr. Syst. 2 (2) (1994)
Razak Hossain, Menghui Zheng, Alexander Albicki
Reducing Power Dissipation in Serially Connected MOSFET Circuits via Transistor Reordering. ICCD (1994)
Xiaodong Xie, Alexander Albicki
Bit-Splitting for Testability Enhancement in Scan-Based Design. ICCD (1993)
Stephen J. Muscato, Alexander Albicki
Locally clocked microprocessor. Great Lakes Symposium on VLSI (1993)
Razak Hossain, Leszek D. Wronski, Alexander Albicki
Double Edge Triggered Devices: Speed and Power Considerations. ISCAS (1993)
Brenda Luderman, Alexander Albicki
An asynchronous multiplier. Great Lakes Symposium on VLSI (1992)
John Compton, Alexander Albicki
Self-timed pipeline with adder. Great Lakes Symposium on VLSI (1992)
Xiaodong Xie, Alexander Albicki, Andrzej Krasniewski
Design of Robust-Path-Delay-Fault-Testable Combinational Circuits by Boolean Space Expansion. ICCD (1992)
Andrzej Krasniewski, Alexander Albicki
Random Testability of Redundant Circuits. ICCD (1991)
Robert F. Molyneaux, Alexander Albicki
Comments on "Ternary Scan Design for VLSI Testability". IEEE Trans. Computers 38 (2) (1989)
Christopher Bucci, Alexander Albicki
An algorithm for voice and data integration on packet-switched local area networks. ICCD (1989)
Rajiv Arora, Alexander Albicki
Prioritized access in CSMA networks: a node partitioning approach. LCN (1988)
Carl Staelin, Alexander Albicki
Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed Control Units. ITC (1985)
Andrzej Krasniewski, Alexander Albicki
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications. DAC (1985)
Andrzej Krasniewski, Alexander Albicki
Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules. ITC (1985)