Random Testability of Redundant Circuits.

Andrzej Krasniewski Alexander Albicki

Published in: ICCD (1991)

Keyphrases

high speed
neural network
vlsi circuits
digital circuits
image segmentation
real world
image processing
decision trees
three dimensional
low cost
information systems
uniformly distributed
logic circuits
analog vlsi
database
highly redundant
eliminate redundant
eliminating redundant
tunnel diode