New advances in path delay fault testing of combinational circuits.
Xiaodong XieAlexander AlbickiPublished in: VTS (1994)
Keyphrases
- logic circuits
- fault diagnosis
- fault model
- recent advances
- fault models
- asynchronous circuits
- shortest path
- fault detection
- real time embedded systems
- power dissipation
- high speed
- fault injection
- recent developments
- analog circuits
- test cases
- path length
- digital circuits
- data sets
- software testing
- neural network
- endpoints
- power consumption
- multiple paths
- delay insensitive
- destination node
- test set
- fault management
- software engineering
- hop count