Random Self-Test Method - Applications on PowerPC (tm) Microprocessor Caches.
Rajesh RainaRobert F. MolyneauxPublished in: Great Lakes Symposium on VLSI (1998)
Keyphrases
- significant improvement
- high accuracy
- pairwise
- cost function
- classification method
- synthetic data
- high precision
- experimental evaluation
- clustering method
- fully automatic
- similarity measure
- test data
- input data
- mutual information
- classification accuracy
- dynamic programming
- computational complexity
- medical images
- optimization algorithm
- support vector machine
- probabilistic model
- computational cost