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Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip.

Robert F. MolyneauxThomas A. ZiajaHong KimShahryar AryaniSungbae HwangAlex Hsieh
Published in: ITC (2007)
Keyphrases
  • web services
  • case study
  • design process
  • circuit design
  • single chip
  • distributed systems
  • database management systems
  • relational databases