An automated method for test model generation from switch level circuits.
Tim McDougallAtanas N. ParashkevovSimon JollyJuhong ZhuJing ZengCarol PyronMagdy S. AbadirPublished in: ASP-DAC (2003)
Keyphrases
- prior knowledge
- detection method
- segmentation method
- high accuracy
- high speed
- optimization method
- objective function
- high precision
- significant improvement
- cost function
- test data
- experimental evaluation
- computational cost
- error rate
- theoretical analysis
- computationally efficient
- edge detection
- classification accuracy
- mathematical model
- circuit design
- synthetic data
- fully automatic
- genetic algorithm
- clustering method
- support vector machine svm
- mutual information
- probabilistic model
- dynamic programming
- preprocessing
- bayesian networks
- training data
- feature selection