ELF-Murphy Data on Defects and Test Sets.
Edward J. McCluskeyAhmad A. Al-YamaniChien-Mo James LiChao-Wen TsengErik H. VolkerinkFrançois-Fabien FerhaniEdward LiSubhasish MitraPublished in: VTS (2004)
Keyphrases
- test set
- database
- training data
- data analysis
- data collection
- data sources
- data quality
- raw data
- data sets
- test data
- data processing
- data structure
- knowledge discovery
- error rate
- machine learning
- experimental data
- statistical analysis
- computer systems
- input data
- image data
- training set
- training samples
- data points
- missing data
- spatial data
- small number
- high quality
- feature extraction
- original data