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and AC Scan: The War Against Unmodelled Defects.

Peter C. MaxwellRobert C. AitkenKathleen R. KollitzAllen C. Brown
Published in: ITC (1996)
Keyphrases
  • defect classification
  • defect detection
  • data sets
  • evolutionary algorithm
  • scan data
  • e learning
  • data structure
  • search algorithm
  • world war ii