Very Low Cost Testers: Opportunities and Challenges.

Jay Bedsole Rajesh Raina Al Crouch Magdy S. Abadir

Published in: IEEE Des. Test Comput. (2001)

Keyphrases

low cost
lessons learned
open issues
highly efficient
test cases
short and long term
technical challenges
decision making
end users
learning environment
real time
data acquisition
digital camera
design principles
artificial intelligence
neural network
application scenarios
databases
data sets