Alfred L. Crouch

Publication Activity (10 Years)

Years Active: 1989-2022
Publications (10 Years): 9

Top Topics

Semiconductor Devices

Integrated Circuit

Current Practices

Statistical Significance

Top Venues

IEEE Instrum. Meas. Mag.

Publications

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
IEEE P1687.1: Extending the Network Boundaries for Test. ITC (2022)
Soha Alhelaly, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, Ping Gui, Alfred L. Crouch
3D Ring Oscillator Based Test Structures to Detect a Trojan Die in a 3D Die Stack in the Presence of Process Variations. IEEE Trans. Emerg. Top. Comput. 9 (2) (2021)
Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC (2020)
Alfred L. Crouch, Adam W. Ley
A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats. IEEE Instrum. Meas. Mag. 23 (5) (2020)
Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song
Innovate Practices on CyberSecurity of Hardware Semiconductor Devices. VTS (2019)
Jeff Rearick, Alfred L. Crouch, Hans Martin von Staudt
Innovative Practices on IEEE 1687.xyz. VTS (2019)
Kareem Madkour, Zhaobo Zhang, Alfred L. Crouch, Peter L. Levin, Eve Hunter, Yu Huang
Innovative practices on machine learning for emerging applications. VTS (2018)
Soha Alhelaly, Jennifer Dworak, Theodore W. Manikas, Ping Gui, Kundan Nepal, Alfred L. Crouch
Detecting a trojan die in 3D stacked integrated circuits. NATW (2017)
Alfred L. Crouch, John C. Potter
Invited - A box of dots: using scan-based path delay test for timing verification. DAC (2016)
Jennifer Dworak, Zoe Conroy, Alfred L. Crouch, John C. Potter
Board security enhancement using new locking SIB-based architectures. ITC (2014)
Zoe Conroy, Alfred L. Crouch
BA-BIST: Board test from inside the IC out. ITC (2013)
Alfred L. Crouch, John C. Potter, Ajay Khoche, Jennifer Dworak
FPGA-Based Embedded Tester with a P1687 Command, Control, and Observe-System. IEEE Des. Test 30 (5) (2013)
Zoe Conroy, James J. Grealish, Harrison Miles, Anthony J. Suto, Alfred L. Crouch, Skip Meyers
Board assisted-BIST: Long and short term solutions for testpoint erosion - Reaching into the DFx toolbox. ITC (2012)
Jason Doege, Alfred L. Crouch
The Advantages of Limiting P1687 to a Restricted Subset. ITC (2008)
Alfred L. Crouch
IJTAG: The path to organized instrument connectivity. ITC (2007)
Zahi S. Abuhamdeh, Vincent D'Alassandro, Richard Pico, Dale Montrone, Alfred L. Crouch, Andrew Tracy
Separating temperature effects from ring-oscillator readings to measure true IR-drop on a chip. ITC (2007)
Zahi S. Abuhamdeh, Bob Hannagan, Jeff Remmers, Alfred L. Crouch
A Production IR-Drop Screen on a Chip. IEEE Des. Test Comput. 24 (3) (2007)
Alfred L. Crouch, Phil Burlison, Dennis J. Ciplickas
Processing High Volume Scan Test Results for Yield Learning. ISQED (2007)
Zahi S. Abuhamdeh, Philip Pears, Jeff Remmers, Alfred L. Crouch, Bob Hannagan
Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks. ITC (2006)
Alfred L. Crouch
Future Trends in Test: The Adoption and Use of Low Cost Structural Testers. ITC (2004)
Alfred L. Crouch, John C. Potter, Jason Doege
AC Scan Path Selection for Physical Debugging. IEEE Des. Test Comput. 20 (5) (2003)
Alfred L. Crouch
Testing the Tester: What Broke? Where? When? Why? ITC (2002)
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
Test Development for a Third-Version ColdFire Microprocessor. IEEE Des. Test Comput. 17 (4) (2000)
Bahram Pouya, Alfred L. Crouch
Optimization trade-offs for vector volume and test power. ITC (2000)
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
The testability features of the 3rd generation ColdFire family of microprocessors. ITC (1999)
Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
Test Development for Second-Generation ColdFire Microprocessors. IEEE Des. Test Comput. 15 (3) (1998)
Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC (1997)
Alfred L. Crouch, Rick Ramus, Colin M. Maunder
Low-Power Mode and IEEE 1149.1 Compliance - A Low-Power Solution. ITC (1994)
Alfred L. Crouch, Matthew Pressly, Joe Circello
Testabilty Features of the MC 68060 Microprocessor. ITC (1994)
Andy Halliday, Greg Young, Alfred L. Crouch
Prototype Testing Simplified by Scannable Buffers and Latches. ITC (1989)