Bradford G. Van Treuren

Publication Activity (10 Years)

Years Active: 2003-2022
Publications (10 Years): 3

Top Topics

Neural Architectures

Modeling Framework

Top Venues

Publications

Michael Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Songlin Zuo
IEEE P1687.1: Extending the Network Boundaries for Test. ITC (2022)
Hans Martin von Staudt, Bradford G. Van Treuren, Jeff Rearick, Michele Portolan, Martin Keim
Exploring and Comparing IEEE P1687.1 and IEEE 1687 Modeling of Non-TAP Interfaces. ETS (2021)
Mike Laisne, Alfred L. Crouch, Michele Portolan, Martin Keim, Hans Martin von Staudt, M. Abdalwahab, Bradford G. Van Treuren, Jeff Rearick
Modeling Novel Non-JTAG IEEE 1687-Like Architectures. ITC (2020)
Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
Executing IJTAG: Are Vectors Enough? IEEE Des. Test 30 (5) (2013)
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
A Common Language Framework for Next-Generation Embedded Testing. IEEE Des. Test Comput. 27 (5) (2010)
Michele Portolan, Bradford G. Van Treuren, Suresh Goyal
Scan chain securization though Open-Circuit Deadlocks. ITC (2010)
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren
Scalable and efficient integrated test architecture. ITC (2009)
Michele Portolan, Suresh Goyal, Bradford G. Van Treuren, Chen-Huan Chiang, Tapan J. Chakraborty, Thomas B. Cook
A New Language Approach for IJTAG. ITC (2008)
Bradford G. Van Treuren, Chen-Huan Chiang, Kenneth Honaker
Problems Using Boundary-Scan for Memory Cluster Tests. ITC (2008)
Bradford G. Van Treuren
System JTAG Initiative Group Advancements. ITC (2008)
Bradford G. Van Treuren, Adam W. Ley
JTAG system test in a MicroTCA world. ITC (2007)
Tapan J. Chakraborty, Chen-Huan Chiang, Bradford G. Van Treuren
A practical approach to comprehensive system test & debug using boundary scan based test architecture. ITC (2007)
Bradford G. Van Treuren, Bryan E. Peterson, José M. Miranda
JTAG-based vector and chain management for system test. ITC (2005)
Bradford G. Van Treuren, José M. Miranda
Embedded Boundary Scan. IEEE Des. Test Comput. 20 (2) (2003)