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Adam W. Ley
Publication Activity (10 Years)
Years Active: 1999-2020
Publications (10 Years): 1
Top Topics
Real Time Embedded
Cyber Security
Telecommunication Systems
Situational Awareness
Top Venues
IEEE Instrum. Meas. Mag.
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Publications
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Alfred L. Crouch
,
Adam W. Ley
A role for embedded instrumentation in real-time hardware assurance and online monitoring against cybersecurity threats.
IEEE Instrum. Meas. Mag.
23 (5) (2020)
Adam W. Ley
Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?
ITC
(2009)
Adam W. Ley
Doing more with less - An IEEE 1149.7 embedded tutorial : Standard for reduced-pin and enhanced-functionality test access port and boundary-scan architecture.
ITC
(2009)
Bradford G. Van Treuren
,
Adam W. Ley
JTAG system test in a MicroTCA world.
ITC
(2007)
Bambang Suparjo
,
Adam W. Ley
,
Adam Cron
,
Heiko Ehrenberg
Analog Boundary-Scan Description Language (ABSDL) for Mixed-Signal Board Test.
ITC
(2006)
Adam W. Ley
The integration of boundary-scan test methods to a mixed-signal environment.
ITC
(1999)
Mike Wondolowski
,
Ben Bennetts
,
Adam W. Ley
Boundary Scan: The Internet of Test.
IEEE Des. Test Comput.
16 (3) (1999)