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Scan chain securization though Open-Circuit Deadlocks.

Michele PortolanBradford G. Van TreurenSuresh Goyal
Published in: ITC (2010)
Keyphrases
  • high speed
  • scan data
  • deadlock detection
  • data sets
  • analog circuits
  • image processing
  • search algorithm
  • distributed database systems
  • static analysis
  • digital circuits