Characterize Predicted vs Actual IR Drop in a Chip Using Scan Clocks.

Zahi S. Abuhamdeh Philip Pears Jeff Remmers Alfred L. Crouch Bob Hannagan

Published in: ITC (2006)

Keyphrases

information retrieval
high speed
low cost
query expansion
high density
scan data
single chip
text retrieval
low power
data sets
information retrieval systems
search engine
neural network
retrieval effectiveness
document collections
evaluation measures
information access
ad hoc retrieval
vlsi implementation