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The testability features of the 3rd generation ColdFire family of microprocessors.
Alfred L. Crouch
Michael Mateja
Teresa L. McLaurin
John C. Potter
Dat Tran
Published in:
ITC (1999)
Keyphrases
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feature extraction
low level
feature space
rich set
feature vectors
prior knowledge
special case
classification accuracy
extracting features
salient features
feature detection
classification models
false positives
feature set
image features
neural network
object recognition
decision trees