Grady Giles

Publication Activity (10 Years)

Years Active: 1985-2017
Publications (10 Years): 3

Top Topics

Decision Support

Management Policies

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood
Maximizing scan pin and bandwidth utilization with a scan routing fabric. ITC (2017)
Yan Dong, Grady Giles, GuoLiang Li, Jeff Rearick, John Schulze, James Wingfield, Tim Wood
Toward more efficient scan data bandwidth utilization on modern SOCs. SoCC (2016)
Wu-Tung Cheng, Yan Dong, Grady Giles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures. IEEE Trans. Very Large Scale Integr. Syst. 23 (6) (2015)
Jakub Janicki, Jerzy Tyszer, Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles
EDT bandwidth management - Practical scenarios for large SoC designs. ITC (2013)
Mahmut Yilmaz, Baosheng Wang, Jayalakshmi Rajaraman, Tom Olsen, Kanwaldeep Sobti, Dwight Elvey, Jeff Fitzgerald, Grady Giles, Wei-Yu Chen
The scan-DFT features of AMD's next-generation microprocessor core. ITC (2010)
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
Test access mechanism for multiple identical cores. ITC (2009)
Kedarnath J. Balakrishnan, Grady Giles, James Wingfield
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. IEEE Des. Test Comput. 26 (1) (2009)
Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja
The Test Features of the Quad-Core AMD Opteron- Microprocessor. ITC (2008)
Grady Giles, Jing Wang, Anuja Sehgal, Kedarnath J. Balakrishnan, James Wingfield
Test Access Mechanism for Multiple Identical Cores. ITC (2008)
Grady Giles, Joel Irby, Daniela Toneva, Kun-Han Tsai
Built-in constraint resolution. ITC (2005)
Grady Giles
Is Scan (Alone) Sufficient to Test Today?s Microprocessors? Not Quite, but We Can?t Get the Job Done Without It. ITC (2002)
Don E. Ross, Tim Wood, Grady Giles
Conversion of small functional test sets of nonscan blocks to scan patterns. ITC (2000)
Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
Test Development for Second-Generation ColdFire Microprocessors. IEEE Des. Test Comput. 15 (3) (1998)
Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors. ITC (1997)
W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
Case study of 1149.01 microprocessor implementations. Microprocess. Microsystems 17 (5) (1993)
W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
Implementing 1149.1 on CMOS Microprocessors. ITC (1992)
W. C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns
Implementing 1149.1 on CMOS Microprocessors. ITC (1991)
Philip E. Bishop, Grady Giles, Sudarshan Iyengar, C. Thomas Glover, Wai-on Law
Testability considerations in the design of the MC68340 Integrated Processor Unit. ITC (1990)
Grady Giles, Kenneth Scheuer
Testability Features of the MC68851 PMMU. ITC (1986)
Grady Giles, Craig Hunter
A Methodology for Testing Content Addressable Memories. ITC (1985)