Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures.
Wu-Tung ChengYan DongGrady GilesYu HuangJakub JanickiMark KassabGrzegorz MrugalskiNilanjan MukherjeeJanusz RajskiJerzy TyszerPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2015)