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Conversion of small functional test sets of nonscan blocks to scan patterns.

Don E. RossTim WoodGrady Giles
Published in: ITC (2000)
Keyphrases
  • test set
  • error rate
  • training set
  • test data
  • training and test sets
  • training data
  • test cases
  • evaluation methodology
  • data mining techniques
  • pattern mining
  • data sets
  • prior knowledge
  • design patterns
  • pattern discovery