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Invited - A box of dots: using scan-based path delay test for timing verification.

Alfred L. CrouchJohn C. Potter
Published in: DAC (2016)
Keyphrases
  • asynchronous circuits
  • database
  • model checking
  • test generation
  • data sets
  • test data
  • statistical significance
  • computer science
  • shortest path
  • test cases
  • black and white
  • verification method
  • scan data
  • destination node