BLACK AND WHITE
Experts
- Ching-Nung Yang
- Chin-Chen Chang
- Jing-Ming Guo
- Carles Padró
- Oriol Farràs
- Oscar C. Au
- Amos Beimel
- Yusuke Matsui
- Xuehu Yan
- Huaxiong Wang
- Kaoru Kurosawa
- Jiwu Huang
- Jeng-Shyang Pan
- Keiichi Iwamura
- Douglas R. Stinson
- Kiyoharu Aizawa
- Wei Lu
- Jan P. Allebach
- Soo-Chang Pei
- Jaume Martí-Farré
- Zhe-Ming Lu
- Peter B. Scott
- Daoshun Wang
- Lein Harn
- Gonzalo R. Arce
- Ming Sun Fu
- Kouichi Sakurai
- Sabyasachi Dutta
- Yong Yan
- Avishek Adhikari
- Jessica J. Fridrich
- Yi-Hui Chen
- Mitsugu Iwamoto
- Bin Yu
- Gang Lu
- Konstantinos N. Plataniotis
- Azriel Rosenfeld
- Wakaha Ogata
- Feng Liu
Venues
- CoRR
- Sensors
- IACR Cryptol. ePrint Arch.
- Multim. Tools Appl.
- ACM Trans. Graph.
- ICIP
- IEEE Trans. Image Process.
- IEEE Access
- Microelectron. J.
- Entropy
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Symmetry
- Color Imaging Conference
- CVPR
- Remote. Sens.
- IEEE Trans. Inf. Forensics Secur.
- IIH-MSP
- J. Digit. Imaging
- ICCV
- DICTA
- ICME
- J. Electronic Imaging
- Pattern Recognit. Lett.
- Des. Codes Cryptogr.
- Inf. Sci.
- PICS
- IWDW
- J. Vis. Commun. Image Represent.
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- Signal Process.
- Comput. Graph. Forum
- ICASSP
- Pattern Recognit.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Signal Process. Image Commun.
- IEEE Trans. Instrum. Meas.
- Cryptologia
- ICPR
- SIGGRAPH Posters
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