BLACK AND WHITE
Experts
- Ching-Nung Yang
- Chin-Chen Chang
- Jing-Ming Guo
- Carles Padró
- Oriol Farràs
- Amos Beimel
- Oscar C. Au
- Yusuke Matsui
- Kiyoharu Aizawa
- Jiwu Huang
- Keiichi Iwamura
- Douglas R. Stinson
- Xuehu Yan
- Jeng-Shyang Pan
- Huaxiong Wang
- Kaoru Kurosawa
- Jaume Martí-Farré
- Soo-Chang Pei
- Wei Lu
- Jan P. Allebach
- Yong Yan
- Lein Harn
- Sabyasachi Dutta
- Daoshun Wang
- Peter B. Scott
- Zhe-Ming Lu
- Kouichi Sakurai
- Ming Sun Fu
- Gonzalo R. Arce
- Konstantinos N. Plataniotis
- Gang Lu
- Avishek Adhikari
- Azriel Rosenfeld
- Yi-Hui Chen
- Wakaha Ogata
- Mitsugu Iwamoto
- Jessica J. Fridrich
- Bin Yu
- Ton Kloks
Venues
- CoRR
- Sensors
- IACR Cryptol. ePrint Arch.
- Multim. Tools Appl.
- ICIP
- ACM Trans. Graph.
- IEEE Access
- IEEE Trans. Image Process.
- Microelectron. J.
- Entropy
- IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
- Remote. Sens.
- CVPR
- Color Imaging Conference
- Symmetry
- IEEE Trans. Inf. Forensics Secur.
- J. Digit. Imaging
- J. Electronic Imaging
- IIH-MSP
- DICTA
- ICME
- ICCV
- Pattern Recognit. Lett.
- Des. Codes Cryptogr.
- Inf. Sci.
- PICS
- ICASSP
- IWDW
- Color Imaging: Displaying, Processing, Hardcopy, and Applications
- J. Vis. Commun. Image Represent.
- IEEE Trans. Instrum. Meas.
- Signal Process.
- Comput. Graph. Forum
- Pattern Recognit.
- AAAI
- Signal Process. Image Commun.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Inf. Theory
- Vis. Comput.
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