Patrick Tounsi

Publication Activity (10 Years)

Years Active: 2002-2019
Publications (10 Years): 6

Top Topics

Close Proximity

Modeling Method

Electromagnetic Field

Top Venues

Microelectron. Reliab.

J. Electron. Test.

Microelectron. J.

Publications

Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
Detecting PCB Assembly Defects Using Infrared Thermal Signatures. MIXDES (2019)
Anaïs Cassou, Patrick Tounsi, Jean-Pierre Fradin
Using Compact Thermal Modelling for the Investigation of a Cooling System Dysfunction Applied to a Power Module with Double Sided Cooling. MIXDES (2019)
Quang Chuc Nguyen, Patrick Tounsi, Jean-Pierre Fradin, Jean-Michel Reynes
Development of SiC MOSFET Electrical Model and Experimental Validation: Improvement and Reduction of Parameter Number. MIXDES (2019)
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
New defect detection approach using near electromagnetic field probing of high density PCBAs. Microelectron. Reliab. (2018)
Nabil El Belghiti Alaoui, Alexandre Boyer, Patrick Tounsi, Arnaud Viard
Upgrading In-Circuit Test of High Density PCBAs Using Electromagnetic Measurement and Principal Component Analysis. J. Electron. Test. 34 (6) (2018)
Nabil El Belghiti Alaoui, Patrick Tounsi, Alexandre Boyer, Arnaud Viard
New testing approach using near electromagnetic field probing intending to upgrade in-circuit testing of high density PCBAs. NATW (2018)
Emmanuel Marcault, Jean-Luc Massol, Patrick Tounsi, Jean-Marie Dorkel
Distributed electrothermal modeling methodology for MOS gated power devices simulations. MIXDES (2013)
Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, Jean-Luc Massol, E. Pomes
Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. Microelectron. Reliab. 53 (9-11) (2013)
Emmanuel Marcault, Marie Breil, A. Bourennane, Patrick Tounsi, Jean-Marie Dorkel
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectron. Reliab. 52 (3) (2012)
Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel
Innovative methodology to extract dynamic compact thermal models: Application to power devices. Microelectron. J. 43 (9) (2012)
Toufik Azoui, Patrick Tounsi, Philippe Dupuy, L. Guillot, Jean-Marie Dorkel
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. Microelectron. Reliab. 51 (9-11) (2011)
Jean-Baptiste Sauveplane, Patrick Tounsi, E. Scheid, A. Deram
3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET. Microelectron. Reliab. 48 (8-9) (2008)
Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Microelectron. Reliab. 48 (8-9) (2008)
B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, E. Scheid
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47 (9-11) (2007)
B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45 (9-11) (2005)
Oliver Perat, Jean-Marie Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42 (7) (2002)