Marc Legros

Publication Activity (10 Years)

Years Active: 2005-2024
Publications (10 Years): 5

Top Topics

Power Distribution

Automatically Segmented

Adaptive Thresholding

Top Venues

Microelectron. Reliab.

Mach. Learn. Sci. Technol.

Publications

Kishan Govind, Daniela Oliveros, Antonin Dlouhy, Marc Legros, Stefan Sandfeld
Deep learning of crystalline defects from TEM images: a solution for the problem of 'never enough training data'. Mach. Learn. Sci. Technol. 5 (1) (2024)
Kishan Govind, Daniela Oliveros, Antonin Dlouhy, Marc Legros, Stefan Sandfeld
Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data". CoRR (2023)
Karina Ruzaeva, Kishan Govind, Marc Legros, Stefan Sandfeld
Instance Segmentation of Dislocations in TEM Images. CoRR (2023)
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
Mechanisms of power module source metal degradation during electro-thermal aging. Microelectron. Reliab. (2017)
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
In-depth investigation of metallization aging in power MOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Donatien Martineau, Colette Levade, Marc Legros, Philippe Dupuy, Thomas Mazeaud
Universal mechanisms of Al metallization ageing in power MOSFET devices. Microelectron. Reliab. 54 (11) (2014)
Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade
Characterization of alterations on power MOSFET devices under extreme electro-thermal fatigue. Microelectron. Reliab. 50 (9-11) (2010)
Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve
Characterization of ageing failures on power MOSFET devices by electron and ion microscopies. Microelectron. Reliab. 49 (9-11) (2009)
B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, E. Scheid
Characterization and modelling of ageing failures on power MOSFET devices. Microelectron. Reliab. 47 (9-11) (2007)
B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45 (9-11) (2005)