Sign in
In-depth investigation of metallization aging in power MOSFETs.
R. Ruffilli
Mounira Berkani
Philippe Dupuy
Stéphane Lefebvre
Y. Weber
Marc Legros
Published in:
Microelectron. Reliab. (2015)
Keyphrases
</>
power consumption
depth information
depth map
software aging
depth images
neural network
machine learning
artificial intelligence
face recognition
search algorithm
literature review
power distribution