Mounira Berkani

Publication Activity (10 Years)

Years Active: 2009-2017
Publications (10 Years): 2

Top Topics

Literature Review

Environmental Conditions

Top Venues

Microelectron. Reliab.

Publications

R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
Mechanisms of power module source metal degradation during electro-thermal aging. Microelectron. Reliab. (2017)
R. Ruffilli, Mounira Berkani, Philippe Dupuy, Stéphane Lefebvre, Y. Weber, Marc Legros
In-depth investigation of metallization aging in power MOSFETs. Microelectron. Reliab. 55 (9-10) (2015)
Michele Riccio, Vincenzo d'Alessandro, Andrea Irace, Gilles Rostaing, Mounira Berkani, Stéphane Lefebvre, Philippe Dupuy
3-D electrothermal simulation of active cycling on smart power MOSFETs during short-circuit and UIS conditions. Microelectron. Reliab. 54 (9-10) (2014)
Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy
Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. Microelectron. Reliab. 53 (9-11) (2013)
D. Othman, Stéphane Lefebvre, Mounira Berkani, Zoubir Khatir, Ali Ibrahim, A. Bouzourene
Robustness of 1.2 kV SiC MOSFET devices. Microelectron. Reliab. 53 (9-11) (2013)
Vanessa Smet, François Forest, Jean-Jacques Huselstein, Frédéric Richardeau, Zoubir Khatir, Stéphane Lefebvre, Mounira Berkani
Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling. IEEE Trans. Ind. Electron. 58 (10) (2011)
Mounira Berkani, Stéphane Lefebvre, Narjes Boughrara, Zoubir Khatir, Jean-Claude Faugières, Peter Friedrichs, Ali Haddouche
Estimation of SiC JFET temperature during short-circuit operations. Microelectron. Reliab. 49 (9-11) (2009)