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Ageing and Failure Modes of IGBT Modules in High-Temperature Power Cycling.

Vanessa SmetFrançois ForestJean-Jacques HuselsteinFrédéric RichardeauZoubir KhatirStéphane LefebvreMounira Berkani
Published in: IEEE Trans. Ind. Electron. (2011)
Keyphrases
  • high temperature
  • failure modes
  • power consumption
  • silicon dioxide
  • fault tree
  • expert systems
  • functional modules
  • modular architecture
  • diesel engine
  • neural network
  • monitoring system
  • simplex method
  • modular structure