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Estimation of SiC JFET temperature during short-circuit operations.

Mounira BerkaniStéphane LefebvreNarjes BoughraraZoubir KhatirJean-Claude FaugièresPeter FriedrichsAli Haddouche
Published in: Microelectron. Reliab. (2009)
Keyphrases
  • short circuit
  • thin film
  • signal processing
  • neural network
  • image processing
  • database systems
  • surface temperature