Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of "Never Enough Training Data".
Kishan GovindDaniela OliverosAntonin DlouhyMarc LegrosStefan SandfeldPublished in: CoRR (2023)
Keyphrases
- deep learning
- transmission electron microscopy
- training data
- image database
- input image
- image features
- three dimensional
- image retrieval
- learning algorithm
- unsupervised learning
- test images
- object recognition
- data sets
- machine learning
- multiple images
- image annotation
- computer vision
- decision trees
- region of interest
- lighting conditions
- partial occlusion
- object detection
- pattern recognition