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Characterization of ageing failures on power MOSFET devices by electron and ion microscopies.
Donatien Martineau
Thomas Mazeaud
Marc Legros
Philippe Dupuy
Colette Levade
G. Vanderschaeve
Published in:
Microelectron. Reliab. (2009)
Keyphrases
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high energy
mobile devices
embedded devices
energy dissipation
power consumption
electron microscopy
search engine
failure detection
root cause
low power
computational power
embedded systems
power distribution
user interface
knowledge base
failure recovery
data sets