Jean-Marie Dorkel

Publication Activity (10 Years)

Years Active: 1999-2013
Publications (10 Years): 0

Top Topics

Distributed Architecture

Agent Based Simulations

Robust Estimation

Modeling Method

Top Venues

Microelectron. Reliab.

Publications

Emmanuel Marcault, Jean-Luc Massol, Patrick Tounsi, Jean-Marie Dorkel
Distributed electrothermal modeling methodology for MOS gated power devices simulations. MIXDES (2013)
Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel, Jean-Michel Reynes, Jean-Luc Massol, E. Pomes
Estimation of power MOSFET junction temperature during avalanche mode: Experimental tests and modelling. Microelectron. Reliab. 53 (9-11) (2013)
Emmanuel Marcault, Marie Breil, A. Bourennane, Patrick Tounsi, Jean-Marie Dorkel
Study of mechanical stress impact on the I-V characteristics of a power VDMOS device using 2D FEM simulations. Microelectron. Reliab. 52 (3) (2012)
Toufik Azoui, Patrick Tounsi, Jean-Marie Dorkel
Innovative methodology to extract dynamic compact thermal models: Application to power devices. Microelectron. J. 43 (9) (2012)
Toufik Azoui, Patrick Tounsi, Philippe Dupuy, L. Guillot, Jean-Marie Dorkel
3D Electro-thermal modelling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. Microelectron. Reliab. 51 (9-11) (2011)
B. Bernoux, René Escoffier, P. Jalbaud, Jean-Marie Dorkel
Source electrode evolution of a low voltage power MOSFET under avalanche cycling. Microelectron. Reliab. 49 (9-11) (2009)
B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin
Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue. Microelectron. Reliab. 45 (9-11) (2005)
Oliver Perat, Jean-Marie Dorkel, E. Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi
Characterization method of thermomechanical parameters for microelectronic materials. Microelectron. Reliab. 42 (7) (2002)
Géraldine Bertrand, Christelle Delage, Marise Bafleur, Nicolas Nolhier, Jean-Marie Dorkel, Quang Nguyen, Nicolas Mauran, David Trémouilles, Philippe Perdu
Analysis and compact modeling of a vertical grounded-base n-p-n bipolar transistor used as ESD protection in a smart power technology. IEEE J. Solid State Circuits 36 (9) (2001)
Christelle Delage, Nicolas Nolhier, Marise Bafleur, Jean-Marie Dorkel, Jo Hamid, Philippe Givelin, Jacques Lin-Kwang
The mirrored lateral SCR (MILSCR) as an ESD protection structure: design and optimization using 2-D device simulation. IEEE J. Solid State Circuits 34 (9) (1999)